Vacuum Probing Systems
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
The Vacuum Probing system can be used from R&D to Production for die, partial wafers and whole wafers. It is ideal for MEMS, Sensors, Switches, Microbolometers or any product that is vacuum packaged.
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