High-Power Probe Systems
SemiProbe configures our PS4L Adaptive Architecture into a family of probe stations to fulfill the unique requirements of testing high-power devices at wafer level prior to packaging. PS4L probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 250 Amps (pulsed).
Our high-power wafer probe systems can test individual die and wafers from 100 mm to 300 mm using manipulators or probe cards. These systems are often designed to control the device temperature and can reach temperatures from -60 C to 300 C. All of our systems are built with a fully guarded, shielded, and interlocked safety system and can interface with multiple brands of test instrumentation.