High Power Devices
SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed). Voltarus probe stations can test individual or die wafers from 100 mm to 300 mm using manipulators or probe cards. Voltarus systems are often designed to control the device temperature and can reach temperatures from -65 C to 300 C. All Voltarus systems are built with a fully guarded, shielded, and interlocked safety system.
