Fully Automatic Probing Systems
SemiProbe manufactures a family of Fully Automatic Probing Systems - single, double-sided, chambered and vacuum using our patented Probe System for Life (PS4L) probing platform. With SemiProbe PS4L probe systems the customer has the option of initially purchasing a Fully Automatic (FA) probe system configured for the application or to field upgrade their existing PS4L Semiautomatic (SA) probe system to a Fully Automatic system. The primary difference between the systems is the FA system includes the automation module. The typical automation module includes a material handling system, an end-effector, a pre-aligner, a chuck lift pin kit, two (2) cassettes, software, and a safety enclosure. Numerous accessories such as thermal chucks, bar code or OCR readers, black bodies, motion analyzers, laser systems, extra cassettes, manipulators, probe card holders, enclosures and more can be added initially or as a field upgrade. The customer has the option of testing a variety of devices automatically – wafers (50 mm to 300 mm – standard, thinned, transparent), wafers mounted on frames, substrates, trays of die and more. All our Fully Automatic probe systems can be configured as single or multi-purpose probing solutions that can be operated in a 24/7 probing environment. The customer has the option of operating our Fully Automatic probe systems in manual, semiautomatic and fully automatic modes.