PS4L Semiautomatic 200 mm Probe System for C-V, I-V Testing using in a Shielded Environment Over Temperature

PS4L Semiautomatic 200 mm Probe System for C-V, I-V Testing in a Shielded Environment and at Cold and Hot Temperatures (-60 C to 200 C)

PS4L Semiautomatic 200 mm Probe System for C-V, I-V Testing using Programmable Manipulators and a Keysight B1500 in a Shielded Environment and at Cold and Hot Temperatures (-60 C to 200 C)

Integrated Optoelectronic Turnkey Device Characterization Solution, which Includes a Semiautomatic PS4L 200 mm Double-Sided Probing System for Testing VCSEL Die, Partial Wafers, and Whole Wafers Over Temperature in a Dark Environment & Test Instrumentation

Fully Automatic 300 mm Probing System for Device Characterization using Programmable Manipulators and Probe Cards in a Dark and Environmentally Controlled Enclosure

Device Characterization Probing Systems

Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements. Probe systems need to interface with a wide variety of instrumentation, requiring software that is modular and easy to interface with. SemiProbe’s PILOT™ software provides full communication with Agilent’s B1500, Keithley’s 4200 and most other test platforms. SemiProbe can design and manufacture cost effective systems to meet most applications and provide new modules to adapt your probe system to your future requirements.

Device Characterization Probing Systems

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