Probe Arms

SemiProbe manufactures an extensive line of standardized and customized probe arms to address applications and test requirements. The SemiProbe family of probe arms can be used on other testing platforms. Call or email for details.

Probe Arms are connected to the manipulator and combined with a probe tip (DC needle, HF probe) to provide mechanical contact to the device under test (pad or line). Probe arms usually are provided with a probe tip mounting mechanism (clamping collet, spring clamp) that allows the probe tip to be positioned and firmly held in place. One end of the probe arm holds the probe tip and the other end has a cable (coaxial, triaxial, HV,HC, HF, etc.) that is approximately 1 m (3’) long terminated with a BNC connector (coaxial, triaxial) that connects directly to the test instrument or a connection panel.

Probe Arm Product Lines:

• Inker Arm
• Coaxial Probe Arm
• Triaxial Probe Arm
• High Voltage/High Current Probe Arms
• Fiber Optic Probe Arm
• Kelvin Probe Arm
• High Frequency (HF) Probe Arm
• PicoProbe Active Proves

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Inker Arm

Information

An inker arm allows the user to ink devices that have electrically or visually failed. It can be attached to a few different SemiProbe manipulators.  The inker arm is adjustable and a family of different ink colors and dot sizes are available.

Application

Used to mark devices that have been determined to be failures – electrically or visually.

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Coaxial Probe Arm

Information

The SemiProbe coaxial probe arm is used with SemiProbe manipulators and probe systems systems. It was specifically designed to minimize mechanical vibrations and electrical losses. One end of the probe arm has a clamping collet. The collet head has three grooved slots that allow the user to insert the probe tip at preset angles of 30, 45 and 180 degrees. After the probe tip is in the desired position the collet is rotated to clamp it into place. To change a probe tip the collet is loosened to allow the old probe tip to be replaced.

The other end of the probe arm is connected to the manipulator’s adjustable faceplate. A 3’ (1M) coaxial cable with a BNC connector is on that end and is connected directly to the test instrumentation or to a bulkhead connector.

The coaxial probe arms are available in a variety of shapes and lengths.
Coaxial Probe Arm – standard with a 3’
(1M) coaxial cable with BNC connector

Application

Most often used probe arm, used for most general purpose DC & AC measurements

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Triaxial Probe Arm

Information

The SemiProbe triaxial probe arm is used with SemiProbe manipulators and probe systems. It was specifically designed to be short to minimize mechanical vibrations and electrical losses. One end of the probe arm has a clamping collet. The collet head has three grooved slots that al- low the user to insert the probe tip at preset angles of 30, 45 and 180 degrees. After the probe tip is in the desired position the collet is rotated to clamp it into place. To change a probe tip the collet is loosened to allow the old probe tip to be replaced. The other end of the probe arm is connected to the manipulator’s adjustable faceplate. A 3’ (1M) triaxial cable with a 3 lug triax connector is on that end and is connected directly to the test instrumentation or to a bulkhead connector. The triaxial probe arms are available in a variety of shapes and lengths.

Triaxial Probe Arm – standard with a 3’ (1M) triaxial cable with triaxial connector

Application

Most often used probe arm for low noise and low level signal measurements (femto level and below)

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High Voltage/High Current Probe Arms

Information

HV Probe Arms are mounted to the front of the manipulator. They are available in 3 KV and 10 KV versions with options in cable and connector types.

HC Probe Arms are mounted to the front of the manipulator and provides pulsed solutions up to 100 A.

Application

High Voltage up to 10 KV and High Current up to 100 A applications.

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Fiber Optic Probe Arm

Information

Fiber Optic Arms are adjustable and have an insert that allows different sized fiber optic cables to be mounted, angled, adjusted and clamped into position. The fiber optic arm is mounted to a standard rigid HF arm that provides a roll capability.

Application

Used to bring a fiber close to the device under test. Fiber normally used to stimulate or detect a light output. Can be used for both topside and bottom side probing applications.

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Kelvin Probe Arm

Information

The SemiProbe kelvin probe arm is manufactured for use with SemiProbe manipulators and probe systems.

The two most popular probe arm models are true and quasi kelvin. True kelvin provides two arms with separate cables and probe tips. One probe is used as a force and the other is used as a sense and the cable terminations are directly to the probe tip or very close to it. The other ends of the cables are connected directly to the test instrumentation or to the bulk head connector panel.

Quasi kelvin probe arms have the termination close to the probe tip but not at the probe tip.

Kelvin Probe Arm – come in a variety of shapes, pitches, tip sizes and connector options

Application

Used most often to force the signal and measure it as close to the device under test (DUT) as possible to eliminate any cable resistance or stray capacitance or in high current applications where the current has to be divided between the two needles to prevent overheating.

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High Frequency (HF) Probe Arm

Information

High Frequency probing applications require the probe arm to be significantly more rigid in comparison to standard DC arms. The SemiProbe HF probe arms are  available in North, South, East, and West configurations and bolt directly to the manipulator face plate. All HF probe arms have a roll capability that allows the user to adjust the probe contact. Standard as well as customized HF arms are available.

HF Probe Arm – allows all industry standard
HF probes from Cascade and GGB to be mounted

Application

Most often used with HF probes, multi-contact wedges and fiber optic probes.

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PicoProbe Active Proves

Information

A family of high impedance active probes with replaceable probe tips that are used in a variety of applications ranging from DC to 26 GHz.

Application

Used to drive IC lines, make capacitance and resistance measurements, make high speed and high impedance measurements, and to make high frequency measurements

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