SemiProbe manufactures an extensive line of standardized and customized probe arms to address applications and test requirements. The SemiProbe family of probe arms can be used on other testing platforms. Call or email for details.
Probe Arms are connected to the manipulator and combined with a probe tip (DC needle, HF probe) to provide mechanical contact to the device under test (pad or line). Probe arms usually are provided with a probe tip mounting mechanism (clamping collet, spring clamp) that allows the probe tip to be positioned and firmly held in place. One end of the probe arm holds the probe tip and the other end has a cable (coaxial, triaxial, HV,HC, HF, etc.) that is approximately 1 m (3’) long terminated with a BNC connector (coaxial, triaxial) that connects directly to the test instrument or a connection panel.
Probe Arm Product Lines:
- Inker Arm
- Coaxial Probe Arm
- Triaxial Probe Arm
- High Voltage/High Current Probe Arms
- Fiber Optic Probe Arm
- Kelvin Probe Arm
- High Frequency (HF) Probe Arm
- PicoProbe Active Proves